UF3000EX

Fully automatic wafer prober for the highest production requirements – now even quicker and more precise

Extremely High Throughput

Highest Probe Power

Optical Measurement System

Very Precise Navigation

Newly developed XY stage drive unit and new calculation procedure for a very high throughput
Improved Z-platform for the highest probe power – for even contact on high pin count probe cards with large surfaces
Highly stable Z-axis with large surface spindle cleaning unit
15 inch LCD Touch Screen for easy operation
Optical Target Scope (OTS) for very precise measurements of the relative positions of Probe Cards and Chucks
Tri-Colour 3-Level Magnifying for colour recording and 3 enhancement levels
Navigation Display Function – the user can manage each desired wafer point by simply touching the wafer map