UF2000: Fast wafertest for 8" wafer

UF2000

Fully automatic Wafer Prober for a high throughput – for 120 to 200 mm wafers

Micrometer precision positioning control

Exact determination of the temperature

Highly efficient Multi-Pin Probing

Precision +-1.5 µm, with the newest optics to determine the positioning precision
Ultra-stable Z/θ platform for Multi-Pin Probing Contact
Precise control of the surrounding temperature – optionally with Low Temperature Chuck or Hot Chuck
High flexibility – numerous options such as the double loader
Simple operation – multifunctional display and touch screen operation
Each drive axis can be separately controlled – for optimum control of each individual component

Related products

Contact

Mr.Mrs.

Product

Last Name*

First name*

Company*

Country*

E-mail*

Phone

Your message

*Mandatory field

By clicking on the button, you agree that ACCRETECH Europe GmbH may send you periodically information tailored to your interests in the field of industrial metrology as well as current offers for our products by e-mail. You also agree that we may submit your personal information to the distributor responsible for your area in order to promote our products (by post, e-mail, telephone). You can revoke your consent to ACCRETECH Europe GmbH at any time. You can find further information about your rights in our privacy policy, via info@accretech.de you can contact us.

UF2000

We are here for you